|
Ipre = 200µA
Isha = 100µA
Ibuf = 100µA
Icomp= 50µA
Ipipe= 40µA
Isf = 100µA
Idrv = 90µA
Vfp = +0.2V
Vcomp= -2.0V
Vfs = +1.5..+0.25V
Vd = -790mV
Vdcl = +960mV
Voffs= -650mV |
The test pulse injection had a bug yielding the
undershoot |
|
|
Ipre = 200µA
Isha = 100µA
Ibuf = 100µA
Icomp= 50µA
Ipipe= 40µA
Isf = 100µA
Idrv = 90µA
Vfp = +0.2V
Vcomp= -2.0V
Vfs = +1.5..-0.125V
Vd = -933mV
Vdcl = +1.53V
Voffs= -353mV |
The test pulse injection had a bug yielding
the undershoot |
|
|
Ipre = 200µA
Isha = 100µA
Ibuf = 100µA
Icomp= 50µA
Ipipe= 30µA
Isf = 100µA
Idrv = 90µA
Vfp = +0.2V
Vcomp= -2.0V
Vfs = +1.5..-0.125V
Vd = -1.008V
Vdcl = +1.22V
Voffs= -243mV |
The test pulse injection bug was detected and removed
and the undershoot was gone. |
|
|
Ipre = 200µA
Isha = 100µA
Ibuf = 100µA
Icomp= 50µA
Ipipe= 30µA
Isf = 100µA
Idrv = 90µA
Vfp = +0.2V
Vcomp= -2.0V
Vfs = +1.5..-0.125V
Vd = -1.072V
Vdcl = +1.75V
Voffs= -102mV |
The undershoot seen in previous pulsescans is caused by a distorted test
pulse signal: It had an exponentially falling flank instead of being a
perfect step function. With the correct test pulse signal, the undershoot
is (almost) gone