| Jahr | 2000 |
| Autor(en) | G. Kreth, P. Edelmann, Ch. Münkel, J. Langowski, C. Cremer |
| Titel | Confocal laser-scanning 3D fluorescence microscopy, quantitative image analysis and computer modelling of X-chromosome territories |
| KIP-Nummer | HD-KIP 00-63 |
| KIP-Gruppe(n) | F2 |
| Dokumentart | Paper |
| Quelle | Proc. Europ. Vongress Electron Microscopy, Vol I |
