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The serial interface

 The programming of the Helix128-2's internal registers is achieved via a simple serial interface of three lines. In Helix128-2.0/2.1 the three signals involved are SerClk, SerData, and SerLoad, in Helix128-2.2/2.3 SerClk has been merged with Rclk and SerData with TrigIn. Thus, in the latter case, programming of the registers will give rise to multiple triggers; it is therefore recommended to keep notReset low during programming. The following explanation applies to Helix128-2.0/2.1, but is easily extended to the new scheme by making the above stated substitution.

During programming of the chip Rclk and SerClk must run continously. A 20 bit word is applied according to the Helix128-2 data frame (fig. 16) on the SerData line synchronously to SerClk (fig. 17). The end of the word is signaled to Helix128-2 by activating SerLoad; note that SerClk must continue running at least one more cycle.

A Helix128-2 serial data frame consists of the following components:

Data are written into the chip with the MSB first. Tab. 5 shows the map of the register addresses.


  
Figure 16: Data format of the Helix128-2 chip
\begin{figure}
\centerline{
\epsfig {file=frame.eps,width=12cm}
}\end{figure}


  
Figure 17: Serial interface timing (Helix128S-2.0/2.1); substituting SerClk by Rclk and SerData by TrigIn gives the programming sequence of Helix128S-2.2/2.3. In the example plotted the Vdcl bias voltage is set to its nominal (Helix128-2.0/2.1/2.2) value of +1V
\begin{figure}
\centerline{
\epsfig {file=serialinterface.eps,width=12cm}
}\end{figure}


 
Table 5: Helix128-2 register map
Register address (HEX) (BIN) (DEC) Register name
01 00001 01 Ipre
02 00010 02 Isha
03 00011 03 Ibuf
04 00100 04 Icomp
05 00101 05 Ipipe
06 00110 06 Isf
07 00111 07 Idriver
08 01000 08 Vfp
09 01001 09 Vfs
0A 01010 10 VcompRef
0B 01011 11 Vd
0C 01100 12 Vdcl
0D 01101 13 Voffset
11 10001 17 Latency
12 10010 18 SyncReg
13 10011 19 ClkDiv
14 10100 20 TokenDelay
 


next up previous contents
Next: Last but not least Up: Digital Control Circuitry Previous: The test pulse circuit

Martin Feuerstack
2/3/1999